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attoSTM I
low temperature scanning tunneling microscope, highly stable and
compact
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The attoSTM I is a scanning tunneling microscope, designed particularly
for applications at low and ultra-low temperatures. The microscope
is manufactured exclusively of non-magnetic materials (predominantly
Titanium) enabling experimental setups compatible with very low
temperatures and high magnetic fields. In the attoSTM I, a
piezoceramic four-quadrant scantube provides the scanning motion
with highest precision on the atomic scale. The scantube is attached
to an ANPz101 nanopositioner mounted in upside-down configuration
providing the motion for the coarse approach. Two ANPxy101 mounted
below the scantube allow coarse positioning of the sample. This
arrangement of the positioning stages in combination with the tube
scanner lead to highest mechanical stability, allowing both atomic
resolution topographic investigations and high signal-to-noise
tunneling spectroscopy measurements.
To ensure the extremely low vibrational level necessary for these
kind of measurements, the attoSTM I - including the cryostat
in which it is operated - is suspended from springs and acoustically
isolated.
Principle - The microscope uses a set of xyz positioners
for coarse positioning of the sample and the tip over several mm.
To achieve maximum stability, the xy and the z stage are separated
from each other. Furthermore, a piezo scantube is implemented with
specifictions according to the users’ requirements. Optical
inspection of the tip/sample is enabled via a CCD camera, an adjustable
prism and an IR-LED for illumination.
The exceptional combination of materials allows absolutely stable
atomic resolution imaging of surfaces.
Request Quotation & Support : |
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Available
Controller for this Product: |
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SPM controller
with xy-scan generator incl. feedback control und fully digital
phase locked loop (PLL) |
| ANC300 |
Piezo positioning controller
for coarse positioning |
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Scan voltage
amplifier for piezo scanning tubes, ultra low noise |
Complete
System Solutions: |
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Complete system
configurations for this product.  |
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| Product
Key Features
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designed
for highest mechanical stability |
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mechanic and acoustic
vibration isolation |
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high sample throughput,
short cooling cycles |
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optical inspection
of sample / tip via CCD camera |
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large coarse movement
in x,y and z |
| Benefits
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very
high resonance frequencies combined with low resonance frequency
vibration isolation for atomic resolution STM/STS |
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access to a large
surface area on a sample |
| Atomic resolution image of a Si(111) surface recorded
at room temperature and high vacuum conditions; scan area
38
x 38 nm (Mr. Amakusa, JEOL, Japan and Dr. Hosoi, Hokkaido
University, Japan). |
| Atomic resolution image of an HOPG surface recorded
at 4 K. (attocube application labs, 2007). |
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