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attoMFM I
low temperature magnetic force microscope, cantilever based
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The attoMFM I is a compact magnetic force microscope designed
particularly for applications at low and ultra low temperature.
Based on a conventional atomic force microscope, the instrument
works by scanning the sample below a fixed magnetic cantilever.
The magnetic force gradient acting on the tip is then determined
by measuring the change in resonance frequency (FM mode) or
phase of the cantilever (AM mode) with highest precision using
a fiber-based optical interferometer. Both measurements techniques
are applied at a certain tip-sample distance, typically around
10 - 100 nm. In FM mode, a phase-locked loop (PLL)
is used to excite the cantilever at resonance.
Request Quotation & Support : |
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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| Product
Key Features
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ultra
compact MFM head |
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highly sensitive
interferometric deflection detection |
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unreached stability |
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optical inspection
of sample / tip via CCD camera |
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adjustment of
the cantilever outside the cryostat prior to cooling the
microscope |
| Benefits
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fits
standard cryogenic and magnet sample spaces |
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highest measurement
sensitivity |
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simultaneous ultra
high resolution topographic and
magnetic force imaging |
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compatible with
any commercially available MFM probe |
MFM measurement
on 300 nm NiFe Pads showing their magnetic structure.
The image was recorded at 300 K with 20 nm tip-sample
separation in dual-pass mode, yielding a spatial resolution
of 10.7 nm and a phase contrast of 2.3 degrees (attocube application labs, 2009). |
| Magnetic phase image of a harddisc recorded
at room temperature (attocube application labs, 2009). |
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