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attoAFM I
low temperature atomic force microscope, cantilever based
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The attoAFM I is a compact atomic force microscope designed particularly
for applications at low and ultra low temperatures. The instrument
works by scanning the sample below a fixed cantilever and by measuring
its deflection with highest precision using a fiber based optical
interferometer. Both contact and non-contact mode are applicable.
Furthermore, this system is suited for Magnetic Force Microscopy
(MFM), Electric Force Microscopy (EFM), and other imaging modes.
The extreme stability of the measurement head allows also for combination
with cryogen free pulse-tube based cooling systems for applications
where liquid Helium is not available or desired.
Principle - The microscope uses a
set of xyz-positioners for coarse positioning of the sample over
a range of several mm. Developed particularly for cryogenic applications,
the piezo scanner ANSxy100 provides a scan range of 30 x 30?µm2
even at liquid helium temperature. In the attoAFM?I configuration,
the adjustment of the cantilever is performed outside of the cryostat
prior to cooling down the microscope. The exceptional combination
of materials allows absolutely stable high resolution imaging of
surfaces. Possible applications are the measurement of local sample
properties such as topography, magnetic forces, or elasticity of
surface structures.
Request Quotation & Support : |
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Available
Controller for this Product:
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FPGA-based, fully digital SPM controller
with xy-scan generator incl. feedback control und phase locked loop (PLL)
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| ANC350 |
Piezo positioning controller
for attocube's encoded positioners| |
| ANC300 |
Piezo positioning controller
for attocube's open-loop positioners | |
Complete
System Solutions:
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Complete system
configurations for this product. |
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| Product
Key Features
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ultra
compact AFM head with unprecedented stability |
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highly sensitive,
non-optical tuning fork sensor |
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LT compatible
preamplifier located in close proximity to tuning fork |
| Benefits
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ultra
high resolution imaging in non-contact mode |
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high Q factor
for highest sensitivity measurements |
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optimized S/N
ratio due to LT compatible preamplifier |
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no optical alignment
necessary |
| Tuning fork AFM image of a patterned Si/SiO-substrate
recorded at 320 mK.Height: 20 ± 2 nm
recorded with the attoAFM III (attocube application
labs, 2007). |
| Tuning fork AFM image of an InAs layer showing monoatomic
steps with a height of 2.04 ± 0.02 Angstrom.
This corresponds well to the atomic lattice constant of InAs,
2.15 Å (attocube application labs, 2007). |
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