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attoSNOM III
fiber based, low temperature scanning near-field optical microscope,
tuning fork sensor
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This system is unique due to the collection of the reflected signal
using an ellipsoidal aluminum mirror. Thus, the attoSNOM III impresses
by its outstanding sensitivity combined with high spatial resolution.
The applicable probes are optical fiber tips. The non-optical tip–sample
distance control is achieved using a piezoelectric quartz force
sensor for highly sensitive shear force detection.
Principle - The excellent spatial
resolution of this instrument is achieved by bringing the aperture
at the apex of an aluminum coated tapered optical fiber tip into
close proximity to the sample surface. The non-optical tip–sample
distance control is achieved by using a piezoelectric tuning fork
force sensor which allows to measure the tip–sample friction
and shear forces. In order to minimize the parasitic cable capacitance
the tuning fork is directly mounted onto a low temperature preamplifier.
In a typical friction force imaging mode, the tip vibration amplitude
at the resonance frequency of the fork is adjusted with a mechanical
dither excitation to be around 50 pm. The friction force is kept
at a constant value using a feedback loop on the tip–sample
distance. The optical fiber-based probe is used in illumination
mode to excite the sample surface locally. The reflected signal
containing the photoluminesence signal is either collected through
the same fiber or using an ellipsoidal aluminum mirror (optional).
Optical access to the sample / focus is enabled via a
CCD camera.
Tip-Sample Distance Control - The
tuning fork sensor as a tip-sample distance control mechanism is
a non-optical method for measuring small vibrations of the SNOM
probe by means of a quartz tuning fork. In general, the glass fiber
tip is glued onto one leg of a small quartz tuning fork. The fiber
based tip is vibrated in horizontal direction; as the tip approaches
the sample in the nanometer range, the vibration amplitude of the
tip decreases. This reduction of the amplitude by the sample due
to lateral forces, the so-called shear forces, is monitored and
kept constant, thus leading to a constant force or gap between
the SNOM probe and the sample surface. The sensor allows to measure
the tip–sample friction and shear forces ranging down to
approximately 0.1 pN. In this configuration, the whole system behaves
like a simple forced harmonic oscillator.
Probes - The attoSNOM III is compatible
to any fiber-based SNOM probe.
Request Quotation & Support : |
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Available
Controller for this Product:
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SPM controller
with xy-scan generator incl. feedback control und fully digital
phase locked loop (PLL)
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Piezo step controller for coarse
positioning | 1, 3 or 6-axes control | Optional: TFT-display,
TTL-input |
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Piezo scan
controller for ultra high resolution scan |
1 to 6-axes control
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Complete
System Solutions:
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Complete system
configurations for this product. 
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| Topography measurement
(a) and phase measurement recorded with a PLL analog feedback
loop (b) of a chess board with 2 µm in period
recorded with the attoSNOM III at ambient conditions. Probe:
glass fiber probe. (K. Karrai et. al., Phys. Rev. B 62,
2000, 13174). |
| Topography measurement (a) and
simultaneously obtained near-field measurement in reflection
(b) and
transmission (c) mode using the attoSNOM III at 4.2 K. Sample: Vanadium
rhomb-structure on glass substrate with a layer thickness of 10 nm (attocube
application labs, 2007). |
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