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SYSTEMS
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MEASUREMENT HEADS
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The measurement task of your choice - The whole range
of microscopy and probing
inserts available.
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Available for |
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Product |
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Description |
LTSYS-He4 |
LTSYS-He3 |
LTSYS-HeDIL |
LTSYS-Cc |
LTSYS-CcADR |
LTSYS-CcDIL |
| CFM - CONFOCAL MICROSCOPES |
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low temperature CFM, highly modular
and flexible |
yes |
no |
no |
on request |
no |
no |
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low temperature CFM, highly modular and flexible |
yes |
yes |
yes |
yes |
yes |
yes |
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low temperature CFM, optimized
for transmission measurements |
yes |
yes |
on request |
yes |
yes |
yes |
| AFM - ATOMIC FORCE MICROSCOPES |
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low temperature AFM, interferometric sensor |
yes |
yes |
on request |
yes |
yes |
yes |
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low temperature AFM, tuning fork sensor |
yes |
yes |
on request |
on request |
on request |
on request |
| SNOM - SCANNING NEARFIELD OPTICAL MICROSCOPES |
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fiber based, low temperature SNOM, interferometric
sensor |
yes |
on request |
no |
on request |
no |
no |
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fiber based, low temperature SNOM, tuning fork sensor |
yes |
yes |
on request |
on request |
on request |
on request |
| STM - SCANNING TUNNELING MICROSCOPE |
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low temperature STM, highly compact and stable |
yes |
yes |
no |
no |
no |
no |
| CRYOGENIC PROBE STATION |
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ultra stable cryogenic probe station |
yes |
no |
no |
yes |
no |
no |
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highly flexible cryogenic probe station |
yes |
no |
no |
yes |
no |
no |
| CUSTOM MEASUREMENT
HEADS |
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Can't find your solution? Ask our application engineers
for your custom solutions [request
form] |
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